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Applied Physics A: Materials Science and Processing

Volumn 95, Issue 1, 2009, Pages 125-130

Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

(4) Huang, Haichao a Wang, Haibo a Zhang, Jidong a Yan, Donghang a

a UNIVERSITY OF CHINESE ACADEMY OF SCIENCES (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRIC CONDUCTIVITY; ELECTRONIC PROPERTIES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PROBES; SIZE DISTRIBUTION; SURFACE POTENTIAL; SURFACE PROPERTIES;

COPPER PHTHALOCYANINES; CRYSTALLINE FACETS; KELVIN PROBE FORCE MICROSCOPIES; LOCAL WORK FUNCTIONS; MICRO-SCALE; ORGANIC SEMICONDUCTORS; P TYPES; POLY-CRYSTALLINE; POLYCRYSTALLINE FILMS; POTENTIAL BARRIERS; SPATIAL DISTRIBUTIONS; SPATIAL ENERGIES; TRAPPING STATE;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 60749111446 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-008-5035-8 Document Type: Article

Times cited : (31)

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