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Volumn 358, Issue 17, 2012, Pages 1946-1953

Relation of defects and grain boundaries to transport and photo-transport: Solved and unsolved problems in microcrystalline silicon

Author keywords

Density of states; Micro crystalline silicon; Transport

Indexed keywords

DENSITY EVALUATION; DENSITY OF STATE; INFLUENCE OF OXYGEN; LOW TEMPERATURES; MACROSCOPIC MEASUREMENTS; MODEL OF TRANSPORT; NANO-METER SCALE; ROOM-TEMPERATURE OPERATION; TRANSPORT; UNSOLVED PROBLEMS;

EID: 84865800329     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2011.09.033     Document Type: Conference Paper
Times cited : (10)

References (62)
  • 11
    • 0014832699 scopus 로고
    • Pergamon Press, Inc
    • J. Tauc Mat. Res. Bull. Vol. 5 1970 Pergamon Press, Inc 721
    • (1970) Mat. Res. Bull. , vol.5 , pp. 721
    • Tauc, J.1
  • 57
    • 84865733987 scopus 로고    scopus 로고
    • B. Rezek, J. Kočka, unpublished results
    • B. Rezek, J. Kočka, unpublished results.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.