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Volumn 93, Issue 8, 2009, Pages 1444-1447

Microcrystalline silicon, grain boundaries and role of oxygen

Author keywords

Electronic transport; Grain boundaries; Hydrogen; Microcrystalline silicon; Oxygen

Indexed keywords

AS DOPING; BAND GAPS; D.C. CONDUCTIVITY; DEFECT PASSIVATION; ELECTRONIC TRANSPORT; HIGH GROWTH-RATE; MODEL OF TRANSPORT; OXYGEN CONTENT; PREFACTOR; SI FILMS;

EID: 67349168117     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.01.013     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.