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Volumn 78, Issue 1-4, 2003, Pages 493-512

Basic features of transport in microcrystalline silicon

Author keywords

Charge transport; Grain boundaries; Microcrystalline silicon

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; DIFFUSION IN SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; GRAIN BOUNDARIES; TRANSPORT PROPERTIES;

EID: 3142677083     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(02)00449-X     Document Type: Article
Times cited : (68)

References (38)
  • 37
    • 4243727721 scopus 로고    scopus 로고
    • unpublished results
    • J. Kočka, et al., unpublished results.
    • Kočka, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.