SCOPUS 정보 검색 플랫폼

Journal of Non-Crystalline Solids

Volumn 299-302, Issue , 2002, Pages 536-540

Fourier transform infrared photocurrent spectroscopy in microcrystalline silicon

(4) Poruba, A a Vanecek M a Meier, J b Shah, A b

a INSTITUTE OF PHYSICS (Czech Republic)

b UNIVERSITY OF NEUCHÂTEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL DEFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; LIGHT REFLECTION; PHOTOIONIZATION; PHOTONS; PHOTOSENSITIVITY; SPECTROMETERS; THIN FILMS;

CONSTANT PHOTOCURRENT METHOD (CPM);

SILICON;

EID: 0036540432 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(01)01022-5 Document Type: Article

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.