Insights and challenges toward understanding the electronic properties of hydrogenated nanocrystalline silicon

Philosophical Magazine

Volumn 89, Issue 28-30, 2009, Pages 2541-2555

  Hugger, Peter ^a   Cohen, J David ^a   Yan, Baojie ^b   Yang, Jeffrey ^b   Guha, Subhendu ^b  

^a UNIVERSITY OF OREGON   (United States)

^b UNITED SOLAR OVONIC LLC   (United States)

Author keywords

A Si:H; Amorphous silicon; Defects; Electronic properties; Micromorph; Mixed phase; Nanocrystals; Nc Si:H; Photovoltaics; Silicon based materials; Thin film solar cells

Indexed keywords

A-SI:H; MICROMORPH; MIXED PHASE; NC-SI:H; PHOTOVOLTAICS; SILICON-BASED MATERIALS; THIN-FILM SOLAR CELLS;

AMORPHOUS FILMS; CAPACITANCE; DEFECTS; ELECTRONIC PROPERTIES; HYDROGENATION; MATERIALS; MICROCRYSTALLINE SILICON; NANOCRYSTALLINE MATERIALS; NANOCRYSTALLINE SILICON; NANOCRYSTALS; PHOTOVOLTAIC EFFECTS; SEMICONDUCTING SILICON COMPOUNDS; SOLAR CELLS; THIN FILM DEVICES;

AMORPHOUS SILICON;

EID: 76849117553     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430902886928     Document Type: Article

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