SCOPUS 정보 검색 플랫폼

Philosophical Magazine

Volumn 89, Issue 28-30, 2009, Pages 2557-2571

Some controversial points related to transport in microcrystalline silicon

(3) Kocka J a Vetushka, A a Fejfar, A a

a INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

Electronic transport; Grain boundary; Microcrystalline silicon

Indexed keywords

AFM TIP; AMORPHOUS SI; BAND GAPS; CRYSTALLINE GRAINS; CRYSTALLINITIES; EFFECTIVE MEDIUM THEORIES; ELECTRICAL CONDUCTIVITY; ELECTRONIC TRANSPORT; LARGE-GRAIN; LIMITING STEP; MICROSCOPIC MEASUREMENT; MODEL OF TRANSPORT; PERCOLATION THRESHOLDS; RANDOM MIXTURES; RESISTIVE COATINGS; ROOM-TEMPERATURE CONDUCTIVITY; SAMPLE SURFACE; TIP-INDUCED;

COATINGS; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MICROCRYSTALLINE SILICON; NANOCRYSTALLINE MATERIALS; NANOCRYSTALLINE SILICON; SEMICONDUCTING SILICON COMPOUNDS; SOLVENTS;

AMORPHOUS SILICON;

EID: 76849083401 PISSN: 14786435 EISSN: 14786443 Source Type: Journal
DOI: 10.1080/14786430903025724 Document Type: Article

Times cited : (7)

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