Comparison of photocurrent spectra measured by FTPS and CPM for amorphous silicon layers and solar cells

Journal of Non-Crystalline Solids

Volumn 354, Issue 19-25, 2008, Pages 2167-2170

  Holovsky J ^a   Poruba, A ^a,b   Purkrt, A ^a   Remes Z ^a   Vanecek M ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b Solartec Sro   (Czech Republic)

Author keywords

Absorption; Band structure; Defects; FTIR measurements; Medium range order; Optical properties; Optical spectroscopy; Photoconductivity; Silicon; Solar cells

Indexed keywords

AMORPHOUS SILICON; BAND STRUCTURE; EMISSION SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; PHOTOCONDUCTIVITY; SOLAR CELLS; ULTRAVIOLET VISIBLE SPECTROSCOPY;

FTIR MEASUREMENTS; MEDIUM-RANGE ORDER; PHOTOCURRENT SPECTRA;

PHOTOCURRENTS;

EID: 43049105029     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.09.106     Document Type: Article

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