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Volumn , Issue , 2010, Pages 165-217

Functional and nanostructured materials investigated by XPS and NEXAFS spectroscopies

Author keywords

Characterization; Electronic structure; NEXAFS; Surface; Synchrotron radiation; XPS

Indexed keywords


EID: 84865258713     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-90-481-3192-1_4     Document Type: Chapter
Times cited : (2)

References (149)
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    • Ade, H.1
  • 49
    • 0038600791 scopus 로고    scopus 로고
    • NEXAFS spectroscopy and microscopy of natural and synthetic polymers
    • Sham TK (ed) World Scientific, Singapore
    • Ade H, Urquhart SG (2002) NEXAFS spectroscopy and microscopy of natural and synthetic polymers. In: Sham TK (ed) Chemical applications of synchrotron radiation. World Scientific, Singapore, pp 285-355
    • (2002) Chemical Applications of Synchrotron Radiation , pp. 285-355
    • Ade, H.1    Urquhart, S.G.2
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    • (1992) Practical Surface Analysis , vol.1 , pp. 85-143
    • Briggs, D.1    Rivière, J.C.2
  • 109


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.