A liquid flow cell to study the electronic structure of liquids with soft X-rays

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 585, Issue 3, 2008, Pages 172-177

  Fuchs, Oliver ^a   Maier, Florian ^a   Weinhardt, Lothar ^b   Weigand, Markus ^a   Blum, Monika ^a   Zharnikov, Michael ^c   Denlinger, Jonathan ^d   Grunze, Michael ^c   Heske, Clemens ^b   Umbach, Eberhard ^a,e  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b UNIVERSITY OF NEVADA   (United States)

^c UNIVERSITY OF HEIDELBERG   (Germany)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

Liquid cell; Soft X ray spectroscopy; Water; X ray absorption; X ray emission

Indexed keywords

ELECTRONIC STRUCTURE; LIQUIDS; VACUUM; X RAY SPECTROSCOPY;

BEAM DAMAGE EFFECTS; INTERNAL AMBIENT PRESSURE; LIQUID CELL; MEMBRANE LIQUID INTERFACE;

X RAYS;

EID: 38349050178     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.10.029     Document Type: Article

References (20)

1. de Groot F. Chem. Rev. 101 (2000) 1779
2. Nordgren J., Glans P., Gunnelin K., Guo J., Skytt P., Såthe C., and Wassdahl N. Appl. Phys. A 65 (1997) 97
3. Head-Gordon T., and Hura G. Chem. Rev. 102 (2002) 2651
4. Wernet Ph., et al. Science 304 (2004) 995
5. Smith J.D., et al. Science 306 (2004) 851
6. Smith J.D., et al. Proc. Natl. Acad. Sci. USA 102 (2005) 14171
7. Laage D., and Hynes J.T. Science 311 (2006) 832
8. Winter B., and Faubel M. Chem. Rev. 106 (2006) 1176
9. Wilson K.R., Rude B.S., Smith J., Cappa C., Co D.T., Schaller R.D., Larsson M., Catalano T., and Saykally R.J. Rev. Sci. Instrum. 75 (2004) 725
10. Myneni S., Luo Y., Naslund L.A., Cavalleri M., Ojamae L., Ogasawara H., Pelmenschikov A., Wernet P., Vaterlein P., Heske C., Hussain Z., Pettersson L.G.M., and Nilsson A. J. Phys. Condens. Matter 14 (2002) L213
11. Yagi S., Matsumura Y., Soda K., Hashimoto E., and Taniguchi M. Surf. Interface Anal. 36 (2004) 1064
12. Freiwald M., Cramm S., Eberhardt W., and Eisebitt S. J. Electron. Spectrosc. Relat. Phenom. 137 (2004) 413
13. Duda L.C., Schmitt T., Augustsson A., and Nordgren J. J. Alloys Compd. 362 (2004) 116
14. Guo J.-H., Luo Y., Augustsson A., Rubensson J.-E., Såthe C., Ågren H., Siegbahn H., and Nordgren J. Phys. Rev. Lett. 89 (2002) 137402
15. Heske C., Groh U., Fuchs O., Weinhardt L., Umbach E., Schedel-Niedrig T., Fischer C.H., Lux-Steiner M.C., Zweigart S., Niesen T.P., Karg F., Denlinger J.D., Rude B., Andrus C., and Powell F. J. Chem. Phys. 119 (2003) 10467
16. Odelius M., Ogasawara H., Nordlund D., Fuchs O., Weinhardt L., Maier F., Umbach E., Heske C., Zubavichus Y., Grunze M., Denlinger J.D., Pettersson L.G.M., and Nilsson A. Phys. Rev. Lett. 94 (2005) 227401
17. Ma Y. J. Electron. Spectrosc. Relat. Phenom. 79 (1996) 131
18. Stöhr J. NEXAFS Spectroscopy, Springer Series in Surface Sciences (1991), Springer, Heidelberg
19. Heske C. Appl. Phys. A 78 (2004) 829
20. O. Fuchs, M. Zharnikov, L. Weinhardt, M. Blum, M. Weigand, Y. Zubavichus, M. Bär, F. Maier, J.D. Denlinger, C. Heske, M. Grunze, E. Umbach, Phys. Rev. Lett., in press.