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Volumn 125, Issue 35, 2003, Pages 10748-10758

Molecular rectification and conductance switching in carbon-based molecular junctions by structural rearrangement accompanying electron injection

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT DENSITY; RAMAN SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0041353860     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0362196     Document Type: Article
Times cited : (163)

References (71)
  • 37
    • 0003074681 scopus 로고    scopus 로고
    • Electron hopping transport in electrochemically active, molecular mixed valent materials
    • Jortner, J., Ratner, M., Eds.; Blackwell Science Ltd.: Cambridge, MA
    • Terrill, R. H.; Murray, R. W. Electron Hopping Transport in Electrochemically Active, Molecular Mixed Valent Materials. In Molecular Electronics; Jortner, J., Ratner, M., Eds.; Blackwell Science Ltd.: Cambridge, MA, 1997; p 215.
    • (1997) Molecular Electronics , pp. 215
    • Terrill, R.H.1    Murray, R.W.2
  • 43
    • 0041842746 scopus 로고    scopus 로고
    • Inelastic electron tunneling spectroscopy
    • John Wiley, Sons Ltd.: Chichester
    • Hipps, K. W.; Mazur, U. Inelastic electron tunneling spectroscopy. In Handbook of Vibrational Spectrosocpy; John Wiley & Sons Ltd.: Chichester, 2002; Vol. 4, p 812.
    • (2002) Handbook of Vibrational Spectrosocpy , vol.4 , pp. 812
    • Hipps, K.W.1    Mazur, U.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.