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Volumn 32, Issue 4, 1999, Pages 1204-1211

Microdomain Morphology of Thin ABC Triblock Copolymer Films

Author keywords

[No Author keywords available]

Indexed keywords

BLOCK COPOLYMERS; DRYING; MICROSCOPIC EXAMINATION; MORPHOLOGY; PHASE SEPARATION; POLYACRYLATES; POLYSTYRENES; SOLVENTS; SWELLING; THIN FILMS; VINYL RESINS;

EID: 0033076608     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma981321m     Document Type: Article
Times cited : (134)

References (36)
  • 6
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    • See, e.g.: Jones; R. A. L.; Norton, L. J.; Kramer, E. J.; Bates, F. S.; Wiltzius, P. Phys. Rev. Lett. 1991, 66, 1326. Bruder, F.; Brenn, R. Phys. Rev. Lett. 1992, 69, 624.
    • (1992) Phys. Rev. Lett. , vol.69 , pp. 624
    • Bruder, F.1    Brenn, R.2
  • 10
    • 0031096528 scopus 로고    scopus 로고
    • We are well aware of recent developments in photoelectron spectroscopy and X-ray microscopy, aiming to achieve chemical information with lateral resolution in the range of some 10 nm. However, while these techniques are likely to become most powerful in recent years, they require quite some machinery (synchrotron sources, expensive UHV equipment, etc.). Therefore, they are not expected to be available on an everyday basis in a typical polymer physics laboratory. (For a recent review on spectromicroscopy/microspectroscopy, see e.g.: Ade, H.; Smith, A. P.; Zhuang, G. R.; Kirz, J.; Rightor, E.; Hitchcock, A. J. Electron Spectrosc. Relat. Phenom. 1997, 84, 53.)
    • (1997) J. Electron Spectrosc. Relat. Phenom. , vol.84 , pp. 53
    • Ade, H.1    Smith, A.P.2    Zhuang, G.R.3    Kirz, J.4    Rightor, E.5    Hitchcock, A.6
  • 14
    • 4143135577 scopus 로고    scopus 로고
    • The reproducible production of suitable SNOM probes combining both high spatial resolution and high enough light transmission is still an unresolved issue. Besides this practical limitation, SNOM shall be limited to polymers containing fluorescent groups as many of the relevant polymers are transparent in the visible. For an in depth discussion of problems related to SNOM, see, e.g.: Hecht, B.; Bielefeldt, H.; Inouye, Y.; Pohl, D. W.; Novotny, L. J. Appl. Phys. 1997, 81, 2492.
    • (1997) Appl. Phys. , vol.81 , pp. 2492
    • Hecht, B.1    Bielefeldt, H.2    Inouye, Y.3    Pohl, D.W.4    Novotny, L.J.5
  • 20
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    • note
    • 2 ice crystals ("snow jet") to remove any organic residues from the surface.
  • 28
    • 0030569142 scopus 로고    scopus 로고
    • We note that first AFM experiments investigating the surface structure of a bulk ABC triblock copolymer were recently reported by Rabe and co-workers: Stocker, W.; Beckman, J.; Stadler, R.; Rabe, J. Macromolecules 1996, 29, 7502.
    • (1996) Macromolecules , vol.29 , pp. 7502
    • Stocker, W.1    Beckman, J.2    Stadler, R.3    Rabe, J.4
  • 32
    • 0003459529 scopus 로고
    • Perkin-Elmer: Eden Prairie, MN
    • We have tested the surface sensitivity of our XPS setup by investigating bilayers of P2VP and PS homopolymers with varying PS top layer thickness. We found that the escape depth of the N Is electrons was less than 6 nm, in agreement with literature values (see, e.g.: Handbook of X-Ray Photoelectron Spectroscopy; Muilenberg, G. E., Ed.; Perkin-Elmer: Eden Prairie, MN, 1978).
    • (1978) Handbook of X-Ray Photoelectron Spectroscopy
    • Muilenberg, G.E.1
  • 33
    • 0001411726 scopus 로고    scopus 로고
    • Dissertation, Universität Mainz
    • Giebeler, E. Dissertation, Universität Mainz, 1997. Giebeler, E.; Stadler, R. Macromol. Chem. Phys. 1997, 198, 3815.
    • (1997)
    • Giebeler, E.1


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