Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source

Journal of Synchrotron Radiation

Volumn 10, Issue 2, 2003, Pages 125-136

  Kilcoyne, A L D ^a   Tyliszczak, T ^b,c   Steele, W F ^c   Fakra, S ^c   Hitchcock, P ^a,b   Franck, K ^c   Anderson, E ^c   Harteneck, B ^c   Rightor, E G ^d   Mitchell, G E ^d   Hitchcock, A P ^b   Yang, L ^b   Warwick, T ^c   Ade, H ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b MCMASTER UNIVERSITY   (Canada)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d DOW CHEMICAL   (United States)

Author keywords

NEXAFS; Scanning microscopy; X rays; Zone plates

Indexed keywords

ARTICLE;

EID: 0344942583     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502017739     Document Type: Article

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