Near edge X-ray absorption fine structure (NEXAFS) studies of copper ion-containing PAMAMOS dendrimer networks

Macromolecular Chemistry and Physics

Volumn 206, Issue 11, 2005, Pages 1146-1153

  Bubeck, Robert A ^a   Dvornic, Petar R ^a   Hu, Jin ^a   Hexemer, Alexander ^b   Li, Xuefa ^c   Keinath, Steven E ^a   Fischer, Daniel A ^d  

^a MICHIGAN MOLECULAR INSTITUTE   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Dendrimer networks; Dendrimers; Nanocomposites; NEXAFS; PAMAMOS

Indexed keywords

ABSORPTION; COMPOSITE MATERIALS; CONCENTRATION (PROCESS); MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURED MATERIALS; POSITIVE IONS; SATURATION (MATERIALS COMPOSITION); X RAY ANALYSIS;

DENDRIMER NETWORKS; NANOCOMPOSITES; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES (NEXAFS); POLY(AMIDOAMINE-ORGANOSILICON) (PAMAMOS);

DENDRIMERS;

EID: 20444481672     PISSN: 10221352     EISSN: None     Source Type: Journal    
DOI: 10.1002/macp.200400341     Document Type: Article

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