Direct determination of the hole density of states in undoped and doped amorphous organic films with high lateral resolution

Physical Review Letters

Volumn 95, Issue 25, 2005, Pages

  Tal, O ^a   Rosenwaks, Y ^a   Preezant, Y ^b   Tessler, N ^b   Chan, C K ^c   Kahn, A ^c  

^a TEL AVIV UNIVERSITY   (Israel)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^c Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ORGANIC FILMS; DOS DOPING-INDUCED BROADENING; KELVIN PROBE FORCE MICROSCOPY; SURFACE POTENTIAL;

DENSITY (SPECIFIC GRAVITY); FIELD EFFECT TRANSISTORS; MICROSTRUCTURE; SEMICONDUCTOR DOPING;

AMORPHOUS FILMS;

EID: 29144496011     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.256405     Document Type: Article

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