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Volumn 24, Issue 14, 2012, Pages 1844-1849

Real-time observation on dynamic growth/dissolution of conductive filaments in oxide-electrolyte-based ReRAM

Author keywords

conductive filament; in situ TEM; nonvolatile memory; resistive switching; solid electrolyte insulator

Indexed keywords

CONDUCTIVE FILAMENTS; IN SITU TEM; NONVOLATILE MEMORY; RESISTIVE SWITCHING; SOLID-ELECTROLYTE INSULATOR;

EID: 84859582233     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201104104     Document Type: Article
Times cited : (553)

References (33)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.