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Volumn 22, Issue 3, 2012, Pages

Analysis of resonance frequency and pull-in voltages of curled micro-bimorph cantilevers

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODE LAYERS; EXPERIMENTAL DATA; METAL ELECTRODE LAYERS; NANOMETRES; PULL-IN VOLTAGE; RESONANCE FREQUENCIES; SOFTENING EFFECT; STATIC MODEL; STRESS-INDUCED; SYSTEMATIC STUDY;

EID: 84857964265     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/22/3/035014     Document Type: Article
Times cited : (15)

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