메뉴 건너뛰기




Volumn 77, Issue 1, 1999, Pages 21-27

Determining thermal expansion coefficients of thin films using micromachined cantilevers

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTROMECHANICAL DEVICES; MICROMACHINING; SUBSTRATES; THERMAL EFFECTS; THERMAL EXPANSION; THIN FILMS;

EID: 0033362640     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00019-9     Document Type: Article
Times cited : (77)

References (21)
  • 1
    • 0030230992 scopus 로고    scopus 로고
    • Determining mean and gradient residual stress in thin films using micromachined cantilevers
    • Fang W., Wickert J.A. Determining mean and gradient residual stress in thin films using micromachined cantilevers. J. Micromech. Microeng. 6:1996;301-309.
    • (1996) J. Micromech. Microeng. , vol.6 , pp. 301-309
    • Fang, W.1    Wickert, J.A.2
  • 2
    • 0024771422 scopus 로고
    • Mechanical property measurements of thin films using load-deflection of composite rectangular membranes
    • Tabata O., Kawahata K., Sugiyama S., Igarashi I. Mechanical property measurements of thin films using load-deflection of composite rectangular membranes. Sensors and Actuators A. 20:1989;135-141.
    • (1989) Sensors and Actuators a , vol.20 , pp. 135-141
    • Tabata, O.1    Kawahata, K.2    Sugiyama, S.3    Igarashi, I.4
  • 3
    • 0026960770 scopus 로고
    • A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films
    • Vlassak J.J., Nix W.D. A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films. J. Mater. Res. 7:1992;3242-3249.
    • (1992) J. Mater. Res. , vol.7 , pp. 3242-3249
    • Vlassak, J.J.1    Nix, W.D.2
  • 4
    • 0030091524 scopus 로고    scopus 로고
    • Thermal conductivity measurements on thin films based on micromechanical devices
    • Jansen E., Obermeier E. Thermal conductivity measurements on thin films based on micromechanical devices. J. Micromech. Microeng. 6:1996;118-121.
    • (1996) J. Micromech. Microeng. , vol.6 , pp. 118-121
    • Jansen, E.1    Obermeier, E.2
  • 5
    • 0029514425 scopus 로고
    • Comments on measuring thin-film stress using bi-layer micromachined beams
    • Fang W., Wickert J.A. Comments on measuring thin-film stress using bi-layer micromachined beams. J. Micromech. Microeng. 5:1995;276-281.
    • (1995) J. Micromech. Microeng. , vol.5 , pp. 276-281
    • Fang, W.1    Wickert, J.A.2
  • 6
    • 0012567846 scopus 로고    scopus 로고
    • Design and performance of a double hot arm polysilicon thermal actuator
    • Austin, TX, Sept.
    • M.B. David, V.M. Bright, Design and performance of a double hot arm polysilicon thermal actuator, Proc. SPIE, Micromacined devices and components III, Vol. 3224, Austin, TX, Sept. 1997, 296-306.
    • (1997) Proc. SPIE, Micromacined Devices and Components III , vol.3224 , pp. 296-306
    • David, M.B.1    Bright, V.M.2
  • 7
    • 0030653431 scopus 로고    scopus 로고
    • Organic thermal and electrostatic ciliary microactuator array for object manipulation
    • Suh J.W., Glander S.F., Darling R.B., Storment C.W. Organic thermal and electrostatic ciliary microactuator array for object manipulation. Sensors and Actuators A. 58:1997;51-60.
    • (1997) Sensors and Actuators a , vol.58 , pp. 51-60
    • Suh, J.W.1    Glander, S.F.2    Darling, R.B.3    Storment, C.W.4
  • 8
    • 0041657161 scopus 로고
    • Recording optical lever
    • Jones R.V. Recording optical lever. J. Sci. Instrum. 36:1959;90.
    • (1959) J. Sci. Instrum. , vol.36 , pp. 90
    • Jones, R.V.1
  • 9
    • 0010397115 scopus 로고
    • A sensitive dilatometer for use at low temperatures
    • Shapiro J.M., Taylor D.R., Graham G.M. A sensitive dilatometer for use at low temperatures. Can. J. Phys. 42:1964;835-847.
    • (1964) Can. J. Phys. , vol.42 , pp. 835-847
    • Shapiro, J.M.1    Taylor, D.R.2    Graham, G.M.3
  • 10
    • 84975549760 scopus 로고
    • A new interferometer capable of measuring small optical path differences
    • Kinzly R.E. A new interferometer capable of measuring small optical path differences. Appl. Opt. 6:1967;137-140.
    • (1967) Appl. Opt. , vol.6 , pp. 137-140
    • Kinzly, R.E.1
  • 11
    • 0014883452 scopus 로고
    • Ultraprecise measurement of thermal expansion coefficients
    • Jacobs S.F., Bradford J.N., Berthold J.W. III Ultraprecise measurement of thermal expansion coefficients. Appl. Opt. 9:1970;2477-2480.
    • (1970) Appl. Opt. , vol.9 , pp. 2477-2480
    • Jacobs, S.F.1    Bradford, J.N.2    Berthold J.W. III3
  • 13
    • 0009642191 scopus 로고
    • X-ray lattice constants of crystals by a rotating camera method: Al, Ar, Au, Cu, Ge, Ne, Si
    • Batchelder D.N., Simmons R.O. X-ray lattice constants of crystals by a rotating camera method: Al, Ar, Au, Cu, Ge, Ne, Si. J. Appl. Phys. 36:1965;2864-2868.
    • (1965) J. Appl. Phys. , vol.36 , pp. 2864-2868
    • Batchelder, D.N.1    Simmons, R.O.2
  • 15
    • 0032387140 scopus 로고    scopus 로고
    • Noncontact method for measuring coefficient of linear thermal expansion of thin films
    • Rafla-Yuan H., Hichwa B.P., Allen T.H. Noncontact method for measuring coefficient of linear thermal expansion of thin films. J. Vac. Sci. Technol. A. 16:1998;3119-3122.
    • (1998) J. Vac. Sci. Technol. a , vol.16 , pp. 3119-3122
    • Rafla-Yuan, H.1    Hichwa, B.P.2    Allen, T.H.3
  • 16
    • 0009037713 scopus 로고
    • Refraction error in a comparator method for measuring thermal expansion
    • Conway J.B., Losekamp A.C. Refraction error in a comparator method for measuring thermal expansion. Rev. Sci. Instrum. 36:1965;1245-1246.
    • (1965) Rev. Sci. Instrum. , vol.36 , pp. 1245-1246
    • Conway, J.B.1    Losekamp, A.C.2
  • 17
    • 0004103045 scopus 로고
    • West Sussex, England, Wiley
    • J.W. Gardner, Microsensors, West Sussex, England, Wiley, 1994.
    • (1994) Microsensors
    • Gardner, J.W.1
  • 18
    • 0001764380 scopus 로고
    • Analysis of bi-metal thermostats
    • Timoshenko S.P. Analysis of bi-metal thermostats. J. Opt. Soc. Am. 11:1925;233-255.
    • (1925) J. Opt. Soc. Am. , vol.11 , pp. 233-255
    • Timoshenko, S.P.1
  • 20
    • 0020127035 scopus 로고
    • Silicon as a mechanical material
    • Petersen K.E. Silicon as a mechanical material. Proc. IEEE. 70:1982;420-457.
    • (1982) Proc. IEEE , vol.70 , pp. 420-457
    • Petersen, K.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.