-
1
-
-
0030230992
-
Determining mean and gradient residual stress in thin films using micromachined cantilevers
-
Fang W., Wickert J.A. Determining mean and gradient residual stress in thin films using micromachined cantilevers. J. Micromech. Microeng. 6:1996;301-309.
-
(1996)
J. Micromech. Microeng.
, vol.6
, pp. 301-309
-
-
Fang, W.1
Wickert, J.A.2
-
2
-
-
0024771422
-
Mechanical property measurements of thin films using load-deflection of composite rectangular membranes
-
Tabata O., Kawahata K., Sugiyama S., Igarashi I. Mechanical property measurements of thin films using load-deflection of composite rectangular membranes. Sensors and Actuators A. 20:1989;135-141.
-
(1989)
Sensors and Actuators a
, vol.20
, pp. 135-141
-
-
Tabata, O.1
Kawahata, K.2
Sugiyama, S.3
Igarashi, I.4
-
3
-
-
0026960770
-
A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films
-
Vlassak J.J., Nix W.D. A new bulge test technique for the determination of Young's modulus and Poisson's ratio of thin films. J. Mater. Res. 7:1992;3242-3249.
-
(1992)
J. Mater. Res.
, vol.7
, pp. 3242-3249
-
-
Vlassak, J.J.1
Nix, W.D.2
-
4
-
-
0030091524
-
Thermal conductivity measurements on thin films based on micromechanical devices
-
Jansen E., Obermeier E. Thermal conductivity measurements on thin films based on micromechanical devices. J. Micromech. Microeng. 6:1996;118-121.
-
(1996)
J. Micromech. Microeng.
, vol.6
, pp. 118-121
-
-
Jansen, E.1
Obermeier, E.2
-
5
-
-
0029514425
-
Comments on measuring thin-film stress using bi-layer micromachined beams
-
Fang W., Wickert J.A. Comments on measuring thin-film stress using bi-layer micromachined beams. J. Micromech. Microeng. 5:1995;276-281.
-
(1995)
J. Micromech. Microeng.
, vol.5
, pp. 276-281
-
-
Fang, W.1
Wickert, J.A.2
-
6
-
-
0012567846
-
Design and performance of a double hot arm polysilicon thermal actuator
-
Austin, TX, Sept.
-
M.B. David, V.M. Bright, Design and performance of a double hot arm polysilicon thermal actuator, Proc. SPIE, Micromacined devices and components III, Vol. 3224, Austin, TX, Sept. 1997, 296-306.
-
(1997)
Proc. SPIE, Micromacined Devices and Components III
, vol.3224
, pp. 296-306
-
-
David, M.B.1
Bright, V.M.2
-
7
-
-
0030653431
-
Organic thermal and electrostatic ciliary microactuator array for object manipulation
-
Suh J.W., Glander S.F., Darling R.B., Storment C.W. Organic thermal and electrostatic ciliary microactuator array for object manipulation. Sensors and Actuators A. 58:1997;51-60.
-
(1997)
Sensors and Actuators a
, vol.58
, pp. 51-60
-
-
Suh, J.W.1
Glander, S.F.2
Darling, R.B.3
Storment, C.W.4
-
8
-
-
0041657161
-
Recording optical lever
-
Jones R.V. Recording optical lever. J. Sci. Instrum. 36:1959;90.
-
(1959)
J. Sci. Instrum.
, vol.36
, pp. 90
-
-
Jones, R.V.1
-
9
-
-
0010397115
-
A sensitive dilatometer for use at low temperatures
-
Shapiro J.M., Taylor D.R., Graham G.M. A sensitive dilatometer for use at low temperatures. Can. J. Phys. 42:1964;835-847.
-
(1964)
Can. J. Phys.
, vol.42
, pp. 835-847
-
-
Shapiro, J.M.1
Taylor, D.R.2
Graham, G.M.3
-
10
-
-
84975549760
-
A new interferometer capable of measuring small optical path differences
-
Kinzly R.E. A new interferometer capable of measuring small optical path differences. Appl. Opt. 6:1967;137-140.
-
(1967)
Appl. Opt.
, vol.6
, pp. 137-140
-
-
Kinzly, R.E.1
-
11
-
-
0014883452
-
Ultraprecise measurement of thermal expansion coefficients
-
Jacobs S.F., Bradford J.N., Berthold J.W. III Ultraprecise measurement of thermal expansion coefficients. Appl. Opt. 9:1970;2477-2480.
-
(1970)
Appl. Opt.
, vol.9
, pp. 2477-2480
-
-
Jacobs, S.F.1
Bradford, J.N.2
Berthold J.W. III3
-
13
-
-
0009642191
-
X-ray lattice constants of crystals by a rotating camera method: Al, Ar, Au, Cu, Ge, Ne, Si
-
Batchelder D.N., Simmons R.O. X-ray lattice constants of crystals by a rotating camera method: Al, Ar, Au, Cu, Ge, Ne, Si. J. Appl. Phys. 36:1965;2864-2868.
-
(1965)
J. Appl. Phys.
, vol.36
, pp. 2864-2868
-
-
Batchelder, D.N.1
Simmons, R.O.2
-
15
-
-
0032387140
-
Noncontact method for measuring coefficient of linear thermal expansion of thin films
-
Rafla-Yuan H., Hichwa B.P., Allen T.H. Noncontact method for measuring coefficient of linear thermal expansion of thin films. J. Vac. Sci. Technol. A. 16:1998;3119-3122.
-
(1998)
J. Vac. Sci. Technol. a
, vol.16
, pp. 3119-3122
-
-
Rafla-Yuan, H.1
Hichwa, B.P.2
Allen, T.H.3
-
16
-
-
0009037713
-
Refraction error in a comparator method for measuring thermal expansion
-
Conway J.B., Losekamp A.C. Refraction error in a comparator method for measuring thermal expansion. Rev. Sci. Instrum. 36:1965;1245-1246.
-
(1965)
Rev. Sci. Instrum.
, vol.36
, pp. 1245-1246
-
-
Conway, J.B.1
Losekamp, A.C.2
-
17
-
-
0004103045
-
-
West Sussex, England, Wiley
-
J.W. Gardner, Microsensors, West Sussex, England, Wiley, 1994.
-
(1994)
Microsensors
-
-
Gardner, J.W.1
-
18
-
-
0001764380
-
Analysis of bi-metal thermostats
-
Timoshenko S.P. Analysis of bi-metal thermostats. J. Opt. Soc. Am. 11:1925;233-255.
-
(1925)
J. Opt. Soc. Am.
, vol.11
, pp. 233-255
-
-
Timoshenko, S.P.1
-
20
-
-
0020127035
-
Silicon as a mechanical material
-
Petersen K.E. Silicon as a mechanical material. Proc. IEEE. 70:1982;420-457.
-
(1982)
Proc. IEEE
, vol.70
, pp. 420-457
-
-
Petersen, K.E.1
|