메뉴 건너뛰기




Volumn 19, Issue 3, 2009, Pages

Effect of undercut on the resonant behaviour of silicon nitride cantilevers

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; RESONANCE; SILICON NITRIDE;

EID: 61849154080     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/19/3/035003     Document Type: Article
Times cited : (45)

References (29)
  • 1
    • 0037185494 scopus 로고    scopus 로고
    • Measurement of the Casimir force between parallel metallic surfaces
    • Bressi G, Carugno G, Onofrio R and Ruoso G 2002 Measurement of the Casimir force between parallel metallic surfaces Phys. Rev. Lett. 88 041804
    • (2002) Phys. Rev. Lett. , vol.88 , Issue.4 , pp. 041804
    • Bressi, G.1    Carugno, G.2    Onofrio, R.3    Ruoso, G.4
  • 4
    • 3142747583 scopus 로고    scopus 로고
    • Single spin detection by magnetic resonance force microscopy
    • Rugar D, Budakian R, Mamin H J and Chui B W 2004 Single spin detection by magnetic resonance force microscopy Nature 430 329-32
    • (2004) Nature , vol.430 , Issue.6997 , pp. 329-332
    • Rugar, D.1    Budakian, R.2    Mamin, H.J.3    Chui, B.W.4
  • 5
    • 3042783205 scopus 로고    scopus 로고
    • Ultrasensitive nanoelectromechanical mass detection
    • Ekinci K L, Huang M H and Roukes M L 2004 Ultrasensitive nanoelectromechanical mass detection Appl. Phys. Lett. 84 4469-71
    • (2004) Appl. Phys. Lett. , vol.84 , Issue.22 , pp. 4469-4471
    • Ekinci, K.L.1    Huang, M.H.2    Roukes, M.L.3
  • 7
    • 51349147454 scopus 로고    scopus 로고
    • An atomic-resolution nanomechanical mass sensor
    • Jensen K, Kim K and Zettl A 2008 An atomic-resolution nanomechanical mass sensor Nat. Nanotechnol. 3 533-7
    • (2008) Nat. Nanotechnol. , vol.3 , Issue.9 , pp. 533-537
    • Jensen, K.1    Kim, K.2    Zettl, A.3
  • 8
    • 7544230375 scopus 로고    scopus 로고
    • Virus detection using nanoelectromechanical devices
    • Illic B, Yang Y and Craighead H G 2004 Virus detection using nanoelectromechanical devices Appl. Phys. Lett. 85 2604-6
    • (2004) Appl. Phys. Lett. , vol.85 , Issue.13 , pp. 2604-2606
    • Illic, B.1    Yang, Y.2    Craighead, H.G.3
  • 10
    • 3042596280 scopus 로고    scopus 로고
    • Enhanced mass sensing using torsional and lateral resonances in microcantilevers
    • Sharos L B, Raman A, Crittenden S and Reifenberger R 2004 Enhanced mass sensing using torsional and lateral resonances in microcantilevers Appl. Phys. Lett. 84 4638-40
    • (2004) Appl. Phys. Lett. , vol.84 , Issue.23 , pp. 4638-4640
    • Sharos, L.B.1    Raman, A.2    Crittenden, S.3    Reifenberger, R.4
  • 11
    • 21244440321 scopus 로고    scopus 로고
    • Enhanced functionality of cantilever based mass sensors using higher modes
    • Dohn S, Sandberg R, Svendsen W and Boisen A 2005 Enhanced functionality of cantilever based mass sensors using higher modes Appl. Phys. Lett. 86 233501-3
    • (2005) Appl. Phys. Lett. , vol.86 , Issue.23 , pp. 233501-233503
    • Dohn, S.1    Sandberg, R.2    Svendsen, W.3    Boisen, A.4
  • 12
    • 33846876588 scopus 로고    scopus 로고
    • Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications
    • Li M, Tang H X and Roukes M L 2007 Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications Nat. Nanotechnol. 2 114-20
    • (2007) Nat. Nanotechnol. , vol.2 , Issue.2 , pp. 114-120
    • Li, M.1    Tang, H.X.2    Roukes, M.L.3
  • 14
    • 3042771616 scopus 로고    scopus 로고
    • Normal and torsional spring constants of atomic force microscope cantilevers
    • Green C P, Lioe H, Mulvaney P and Sader J E 2004 Normal and torsional spring constants of atomic force microscope cantilevers Rev. Sci. Instrum. 75 1988-96
    • (2004) Rev. Sci. Instrum. , vol.75 , Issue.6 , pp. 1988-1996
    • Green, C.P.1    Lioe, H.2    Mulvaney, P.3    Sader, J.E.4
  • 15
  • 18
    • 47149083474 scopus 로고    scopus 로고
    • Flexural resonant frequencies of thin rectangular cantilever plates
    • Looker J R and Sader J E 2008 Flexural resonant frequencies of thin rectangular cantilever plates J. Appl. Mech. 75 011007
    • (2008) J. Appl. Mech. , vol.75 , Issue.1 , pp. 011007
    • Looker, J.R.1    Sader, J.E.2
  • 25
    • 1542306888 scopus 로고    scopus 로고
    • Young's modulus of silicon nitride used in scanning force microscope cantilevers
    • Khan A, Philip J and Hess P 2004 Young's modulus of silicon nitride used in scanning force microscope cantilevers J. Appl. Phys. 95 1667-72
    • (2004) J. Appl. Phys. , vol.95 , Issue.4 , pp. 1667-1672
    • Khan, A.1    Philip, J.2    Hess, P.3
  • 26
    • 0035943835 scopus 로고    scopus 로고
    • Single-crystal aluminum nitride nanomechanical resonators
    • Cleland A N, Pophristic M and Ferguson I 2001 Single-crystal aluminum nitride nanomechanical resonators Appl. Phys. Lett. 79 2070-2
    • (2001) Appl. Phys. Lett. , vol.79 , Issue.13 , pp. 2070-2072
    • Cleland, A.N.1    Pophristic, M.2    Ferguson, I.3
  • 27
    • 3843082844 scopus 로고    scopus 로고
    • On thermal and mechanical simulations and experiments in micro- electronics and micro-systems
    • Yahiaoui R and Bosseboeuf A 2004 On thermal and mechanical simulations and experiments in micro- electronics and micro-systems 5th Int. Conf. EuroSim E. 377-84
    • (2004) 5th Int. Conf. EuroSim E. , pp. 377-384
    • Yahiaoui, R.1    Bosseboeuf, A.2
  • 29
    • 0024639713 scopus 로고
    • Free vibration of stepped beams: Exact and numerical solutions
    • Jang S K and Bert C W 1989 Free vibration of stepped beams: exact and numerical solutions J. Sound Vib. 130 342-6
    • (1989) J. Sound Vib. , vol.130 , Issue.2 , pp. 342-346
    • Jang, S.K.1    Bert, C.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.