Scanning noise microscopy on graphene devices

ACS Nano

Volumn 5, Issue 11, 2011, Pages 8620-8628

  Sung, Moon Gyu ^a   Lee, Hyungwoo ^a   Heo, Kwang ^a   Byun, Kyung Eun ^a   Kim, Taekyeong ^a   Seo, David H ^b   Seo, Sunae ^b,c   Hong, Seunghun ^a  

^a Seoul National University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Sejong University   (South Korea)

Author keywords

atomic force microscopy; graphene strip; low frequency noise; nanodevice; scanning noise microscopy

Indexed keywords

BASIC RESEARCH; CURRENT NOISE; DEVICE CHANNEL; DIRECT CONTACT; EMPIRICAL MODEL; GRAPHENE DEVICES; LOW-FREQUENCY NOISE; NANO DEVICE; NANO SCALE; NANOSCALE DEVICE; NOISE ANALYSIS; NOISE CHARACTERISTIC; NOISE MAPPING; NOISE SPECTRA; PROOF OF CONCEPT; SCALING BEHAVIOR; STRUCTURAL DEFECT;

ATOMIC FORCE MICROSCOPY; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NOISE POLLUTION; PLATINUM; SCANNING;

GRAPHENE;

GRAPHITE;

ARTICLE; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY;

GRAPHITE; MICROSCOPY; NANOTECHNOLOGY;

EID: 81855190712     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn202135g     Document Type: Article

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