Static noise margin analysis of sub-threshold SRAM cells in deep sub-micron technology

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3728 LNCS, Issue , 2005, Pages 488-497

  Wellig, Armin ^a   Zory, Julien ^a  

^a STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER ARCHITECTURE; COMPUTER SIMULATION; ELECTRIC POWER SYSTEMS; MICROELECTRONICS; THRESHOLD VOLTAGE;

DEEP SUBMICRON TECHNOLOGY; STATIC NOISE MARGIN ANALYSIS; SUPPLY VOLTAGE;

STATIC RANDOM ACCESS STORAGE;

EID: 33646391916     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11556930_50     Document Type: Conference Paper

References (13)

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