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Volumn 9, Issue 2, 2007, Pages 133-138
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Supercritical carbon dioxide-assisted oxidative degradation and removal of polymer residue after reactive ion etching of photoresist
a a a a a b b a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33846913647
PISSN: 14639262
EISSN: 14639270
Source Type: Journal
DOI: 10.1039/b602885c Document Type: Article |
Times cited : (5)
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References (24)
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