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Volumn 9, Issue 2, 2007, Pages 133-138

Supercritical carbon dioxide-assisted oxidative degradation and removal of polymer residue after reactive ion etching of photoresist

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Indexed keywords


EID: 33846913647     PISSN: 14639262     EISSN: 14639270     Source Type: Journal    
DOI: 10.1039/b602885c     Document Type: Article
Times cited : (5)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.