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Volumn 85, Issue 18, 2004, Pages 4172-4174

1/f noise in single-walled carbon nanotube devices

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE DEVICES; NANOMETER-SCALE DEVICES; NOISE SCALE; SINGLE WALLED CARBON NANOTUBES (SWNT);

EID: 10044277094     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1812838     Document Type: Article
Times cited : (135)

References (21)
  • 14
    • 10044241256 scopus 로고    scopus 로고
    • note
    • The noise was measured at zero gate bias. For each device we confirmed that the 10 Hz noise was dominated by a 1/f component.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.