Probing charge transport of ruthenium-complex-based molecular wires at the single-molecule level

ACS Nano

Volumn 2, Issue 11, 2008, Pages 2315-2323

  Liu, Ke ^a,b   Wang, Xianhong ^a   Wang, Fosong ^a  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Barrier height; Conductive probe atomic force microscopy; Electronic decay constant; Ruthenium complex enhanced charge transport; Scanning tunneling microscopy; Single molecular conductance; Technique combination method

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; GOLD COMPOUNDS; MOLECULAR ORBITALS; MOLECULES; NANOWIRES; ORGANIC POLYMERS; POLYETHYLENES; RUTHENIUM; RUTHENIUM COMPOUNDS; SCANNING; TUNNELING (EXCAVATION); WIRE;

BARRIER HEIGHT; CONDUCTIVE PROBE-ATOMIC FORCE MICROSCOPY; ELECTRONIC DECAY CONSTANT; SINGLE MOLECULAR CONDUCTANCE; TECHNIQUE-COMBINATION METHOD;

SCANNING TUNNELING MICROSCOPY;

POLY(PHENYLENE ETHYNYLENE); POLYMER; RUTHENIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; CONFORMATION; ELECTROCHEMISTRY; ELECTRON; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTROPHOTOMETRY;

ELECTROCHEMISTRY; ELECTRONS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING TUNNELING; MODELS, CHEMICAL; MOLECULAR CONFORMATION; NANOTECHNOLOGY; POLYMERS; QUANTUM THEORY; RUTHENIUM; SPECTROPHOTOMETRY, ULTRAVIOLET; SURFACE PROPERTIES; ULTRAVIOLET RAYS;

EID: 58049191556     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn800475a     Document Type: Article

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