Probing the nanoscale

Science

Volumn 328, Issue 5975, 2010, Pages 183-184

  Cook, Robert F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MECHANICAL PROPERTY; NANOTECHNOLOGY; PROBE; SCIENCE AND TECHNOLOGY;

ATOMIC FORCE MICROSCOPY; DEVICE; MOLECULAR MECHANICS; NANOANALYSIS; OSCILLATION; PRIORITY JOURNAL; SHORT SURVEY;

EID: 77950824949     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1186023     Document Type: Short Survey

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