Scanning local-acceleration microscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 794-799

  Burnham, N A ^a   Kulik, A J ^a   Gremaud, G ^a   Gallo, R J ^a   Oulevey, F ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5544315851     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588715     Document Type: Article

References (21)

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