Comment on tilt of atomic force microscope cantilevers: Effect on spring constant and adhesion measurements

Langmuir

Volumn 21, Issue 6, 2005, Pages 2630-2632

  Hutter, Jeffrey L ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; CURVE FITTING; DATA REDUCTION; ELASTIC MODULI; MATHEMATICAL TRANSFORMATIONS; TORQUE;

ADHESION MEASUREMENTS; CANTILEVER BENDS; SPRING CONSTANT; VERTICAL FORCE;

COMPUTATIONAL GEOMETRY;

EID: 15844400525     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la047670t     Document Type: Review

References (7)

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2. Sarid, D. Scanning Force Microscopy; Oxford University Press: Oxford, 1994; p 5.
3. Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Rev. Sci. Instrum. 1995, 66, 3789-3798.
4. Sader, J. E.; Larson, Ian; Mulvaney, P.; White, L. R. Rev. Sci. Instrum. 1993, 64, 403-405.
5. Hutter, J. L.; Bechhoefer, J. Rev. Sci. Instrum. 1993, 64, 1868-1873.
6. Butt, H.-J.; Jaschke, M. Nanotechnology 1995, 6, 1-7.
7. Walters, D. A.; Cleveland, J. F.; Thomson, N. H.; Hansma, P. K.; Wendman, M. A.; Gurley, G.; Elings, V. Rev. Sci. Instrum. 1996, 67, 3580-3590.