Magnetic sensitive force microscopy

Nano Today

Volumn 3, Issue 1-2, 2008, Pages 28-39

  Schwarz, Alexander ^a   Wiesendanger, Roland ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; FERROMAGNETIC MATERIALS; IMAGE RESOLUTION; IMAGING TECHNIQUES; MAGNETOSTATICS;

ATOMIC SCALE; HIGH-RESOLUTION MAGNETIC IMAGING; MAGNETIC SENSITIVE FORCE MICROSCOPY;

MAGNETIC FORCE MICROSCOPY;

FERROMAGNETIC MATERIAL; MOLECULAR SCAFFOLD;

ATOMIC FORCE MICROSCOPY; CHEMICAL STRUCTURE; IMAGE ANALYSIS; IMAGE ENHANCEMENT; IMAGE PROCESSING; IMAGE QUALITY; MAGNETIC EXCHANGE FORCE MICROSCOPY; MAGNETIC SENSITIVE FORCE MICROSCOPY; MAGNETISM; MATHEMATICAL COMPUTING; MICROSCOPY; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; NANOIMAGING; PARTICLE SIZE; PHYSICAL CHEMISTRY; REVIEW; SENSITIVITY AND SPECIFICITY;

EID: 39749093789     PISSN: 17480132     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1748-0132(08)70013-6     Document Type: Review

References (56)

1. Bitter F. Phys. Rev. 41 (1932) 507
2. Hubert A., and Schäfer R. Magnetic domains: the analysis of magnetic microstructures (2000), Springer 24
3. Chapman J.N. J. Phys. D: Appl. Phys. 17 (1984) 623
4. Oepen H.P., and Kirschner J. Scanning Microsc. 5 (1991) 1
5. Schneider C.M. J. Magn. Magn. Mater. 156 (1996) 94
6. Chang A.M., et al. Appl. Phys. Lett. 61 (1992) 1974
7. Kirtley J.R., and Wikswo Jr. J.P. Annu. Rev. Mater. Res. 29 (1999) 117
8. Hartmann U. Annu. Rev. Mater. Res. 29 (1999) 53
9. Bode M. Rep. Prog. Phys. 66 (2003) 523
10. Kaiser U., et al. Nature 446 (2007) 522
11. Binnig G., et al. Phys. Rev. Lett. 56 (1986) 930
12. Wadas A., et al. Appl. Phys. Lett. 64 (1994) 1156
13. Löhndorf M., et al. Appl. Phys. Lett. 68 (1996) 3635
14. Schneider M., et al. J. Appl. Phys. 79 (1996) 8578
15. Shinjo T., et al. Science 289 (2000) 930
16. Moser A., et al. Phys. Rev. Lett. 74 (1995) 1847
17. Volodin A., et al. Appl. Phys. Lett. 73 (1998) 1134
18. Liebmann M., et al. Rev. Sci. Instrum. 73 (2002) 3508
19. Schwarz A., et al. Phys. Rev. Lett. 92 (2004) 077206
20. Liebmann M., et al. Phys. Rev. B 71 (2005) 104431
21. Schwarz A., et al. Appl. Phys. Lett. 88 (2006) 012507
22. Pi U.H., et al. Phys. Rev. B 73 (2006) 144505
23. Wiesendanger R., et al. J. Vac. Sci. Technol. B 9 (1991) 519
24. Mukasa K., et al. Jpn. J. Appl. Phys. 33 (1994) 2692
25. Nakamura L., et al. Jpn. J. Appl. Phys. 37 (1998) 6575
26. Foster A.S., and Shluger A.L. Surf. Sci. 490 (2001) 211
27. Momida H., and Oguchi T. Surf. Sci. 590 (2005) 42
28. Hoffmann R., et al. Phys. Rev. B 67 (2003) 085402
29. Hosoi H., et al. Nanotechnology 15 (2004) 505
30. Hölscher H., et al. Appl. Phys. Lett. 81 (2002) 4428
31. Langkat S.M., et al. Surf. Sci. 527 (2003) 12
32. Si cantilevers SSS-NCL and PPP-NCL from Nanosensors, www.nanosensors.com
33. Albrecht T., et al. J. Appl. Phys. 69 (1991) 668
34. Giessibl F.-J. Science 267 (1995) 68
35. In: Morita S., et al. (Ed). Noncontact Atomic Force Microscopy (2002), Springer
36. Pérez R., et al. Phys. Rev. Lett. 78 (1997) 678
37. Dreyer M., et al. Appl. Phys. A 66 (1998) S1209
38. Nonnenmacher M., et al. Appl. Phys. Lett. 58 (1991) 2921
39. Hubert A., et al. Phys. Status Solidi B 204 (1997) 817
40. Wright C.D., and Hill E.W. Appl. Phys. Lett. 67 (1995) 433
41. Kwon C., et al. J. Magn. Magn. Mater. 172 (1997) 229
42. Van Tendeloo G., et al. J. Magn. Magn. Mater. 211 (2000) 73
43. Jiang J.C., et al. Appl. Phys. Lett. 80 (2002) 4831
44. Okazawa T., et al. Phys. Rev. B 67 (2003) 195406
45. Ciraci S., et al. Phys. Rev. B 41 (1990) 2763
46. Kaiser, U., et al., unpublished data
47. Heinze S., et al. Science 288 (2000) 1805
48. Nogués J., and Schuller I.K. J. Magn. Magn. Mater. 192 (1999) 203
49. Heinrich A.J., et al. Science 306 (2004) 466
50. Gauthier M., and Tsukada M. Phys. Rev. B 60 (1999) 11716
51. Trevethan T., and Kantorovich L. Nanotechnology 15 (2004) S34
52. Hoffmann R., et al. Nanotechnology 18 (2007) 395503
53. Lantz M.A., et al. Science 291 (2001) 2580
54. Bode M., and Wiesendanger R. Spin-Polarized Scanning Tunneling Microscopy. In: Zhu Y. (Ed). Modern Techniques for Characterizing Magnetic Materials (2005), Springer
55. Bode M., and Wiesendanger R. Spin-Polarized Scanning Tunneling Spectroscopy. In: Hopster H., and Oepen H.P. (Eds). Magnetic Microscopy of Nanostructures (2005), Springer
56. Schwarz A., et al. Scanning Probe Techniques: MFM and SP-STM. In: Kronmüller H., and Parkin S. (Eds). Handbook of Magnetism and Advanced Magnetic Materials 3 (2007), Wiley