Estimating the transfer function of the cantilever in atomic force microscopy: A system identification approach

Journal of Applied Physics

Volumn 98, Issue 11, 2005, Pages

  Stark, Martin ^a,b   Guckenberger, Reinhard ^a   Stemmer, Andreas ^c   Stark, Robert W ^c,d  

^a MAX PLANCK INSTITUTE OF BIOCHEMISTRY   (Germany)

^b EPFL   (Switzerland)

^c ETH ZURICH   (Switzerland)

^d UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION SENSITIVITY; EMPIRICAL TRANSFER FUNCTION ESTIMATE (ETFE); FORCE SENSORS; SPRING CONSTANTS;

ATOMIC FORCE MICROSCOPY; DYNAMIC RESPONSE; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION; SENSORS; SURFACE PROPERTIES; TRANSFER FUNCTIONS;

CANTILEVER BEAMS;

EID: 29144508705     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2137887     Document Type: Article

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