Nanoelectromechanics of piezoelectric indentation and applications to scanning probe microscopies of ferroelectric materials

Philosophical Magazine

Volumn 85, Issue 10, 2005, Pages 1017-1051

  Karapetian, E ^a   Kachanov, M ^b   Kalinin, S V ^c  

^a SUFFOLK UNIVERSITY   (United States)

^b Tufts University   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; FERROELECTRIC MATERIALS; HYSTERESIS; INDENTATION; PIEZOELECTRIC MATERIALS; PIEZOELECTRICITY;

ELECTROMECHANICAL SCANNING; ELEMENTARY FUNCTION; NANAOELECTROMECHANICS; PIEZOELETRIC INDENTATION;

NANOTECHNOLOGY;

EID: 27744456702     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430412331324680     Document Type: Article

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