New modes for subsurface atomic force microscopy through nanomechanical coupling

Nature Nanotechnology

Volumn 5, Issue 2, 2010, Pages 105-109

  Tetard, L ^a,b   Passian, A ^a,b   Thundat, T ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGICAL MATERIALS; MECHANICAL PROPERTIES; PROBES; TOPOGRAPHY;

FORCE MICROSCOPY; FORCE SENSING CANTILEVERS; NANOSCALE CHARACTERIZATION; NON DESTRUCTIVE; OPERATIONAL MODES; OTHER PROPERTIES; REPULSIVE FORCES; SUBSURFACE INFORMATION;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; MICROSCOPE; MOLECULAR MECHANICS; MOLECULAR PROBE; PLANT CELL; PRIORITY JOURNAL; SPECTRUM; SURFACE PROPERTY;

EID: 76649087625     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2009.454     Document Type: Article

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