Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis

Ultramicroscopy

Volumn 77, Issue 3-4, 1999, Pages 97-112

  Bonnet, N ^a   Brun, N ^b   Colliex, C ^b,c  

^a INSERM   (France)

^b UNIVERSITÉ PARIS SUD   (France)

^c LABORATOIRE AIMÉ COTTON   (France)

Author keywords

EELS; Interface; Multivariate statistical analysis

Indexed keywords

COMPUTER SIMULATION; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SILICA; SILICON; STATISTICAL METHODS; TITANIUM DIOXIDE;

MULTIVARIATE STATISTICAL ANALYSIS (MSA);

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARTICLE; COMPUTER INTERFACE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; INFORMATION PROCESSING; MATHEMATICAL ANALYSIS; MICROANALYSIS; MULTIVARIATE ANALYSIS; SIGNAL PROCESSING;

EID: 0033166737     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00042-X     Document Type: Article

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