-
1
-
-
0034258881
-
Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs
-
S.H. Oh, D. Monroe, and J.M. Hergenrother Analytic description of short-channel effects in fully-depleted double-gate and cylindrical, surrounding-gate MOSFETs IEEE Electron Dev Lett 21 2000 445
-
(2000)
IEEE Electron Dev Lett
, vol.21
, pp. 445
-
-
Oh, S.H.1
Monroe, D.2
Hergenrother, J.M.3
-
2
-
-
0041525428
-
A physical short-channel threshold voltage model for undoped symmetric double-gate MOSFETs
-
Q. Chen, E.M. Harrell, and J.D. Meindl A physical short-channel threshold voltage model for undoped symmetric double-gate MOSFETs IEEE Trans Electron Dev 50 2003 1631
-
(2003)
IEEE Trans Electron Dev
, vol.50
, pp. 1631
-
-
Chen, Q.1
Harrell, E.M.2
Meindl, J.D.3
-
3
-
-
34249880805
-
Two-dimensional analytical threshold voltage and subthreshold swing models of undoped symmetric double-gate MOSFETs
-
H.A. El Hamid, J.R. Guitart, and B. Iniguez Two-dimensional analytical threshold voltage and subthreshold swing models of undoped symmetric double-gate MOSFETs IEEE Trans Electron Dev 54 2007 1402
-
(2007)
IEEE Trans Electron Dev
, vol.54
, pp. 1402
-
-
El Hamid, H.A.1
Guitart, J.R.2
Iniguez, B.3
-
4
-
-
0033697180
-
Scaling challenges and device design requirements for high performance sub-50 nm gate length planar CMOS transistors
-
Ghani T, Mistry K, Packan P, Thompson S, Stettler M, Tyagi S, Bohr M. Scaling challenges and device design requirements for high performance sub-50 nm gate length planar CMOS transistors. In: VLSI Symp. Tech. Dig; 2000. p. 174.
-
(2000)
VLSI Symp. Tech. Dig;
, pp. 174
-
-
Ghani, T.1
Mistry, K.2
Packan, P.3
Thompson, S.4
Stettler, M.5
Tyagi, S.6
Bohr, M.7
-
6
-
-
19944379142
-
Multiple gate devices: Advantages and challenges
-
T. Poiroux, M. Vinet, O. Faynot, J. Widiez, J. Lolivier, and T. Ernst Multiple gate devices: advantages and challenges Microelectron Eng 80 2005 378
-
(2005)
Microelectron Eng
, vol.80
, pp. 378
-
-
Poiroux, T.1
Vinet, M.2
Faynot, O.3
Widiez, J.4
Lolivier, J.5
Ernst, T.6
-
7
-
-
0033329310
-
Sub 50-nm FinFET: PFET
-
X. Huang, W.C. Lee, C. Kuo, D. Hisamoto, L. Chang, and J. Kedzierski Sub 50-nm FinFET: PFET Tech Dig IEDM 1999 67
-
(1999)
Tech Dig IEDM
, pp. 67
-
-
Huang, X.1
Lee, W.C.2
Kuo, C.3
Hisamoto, D.4
Chang, L.5
Kedzierski, J.6
-
8
-
-
50549103108
-
Threshold voltage model for short-channel undoped symmetrical double-gate MOSFETs
-
A. Tsormpatzoglou, C.A. Dimitriadis, R. Clerc, G. Pananakakis, and G. Ghibaudo Threshold voltage model for short-channel undoped symmetrical double-gate MOSFETs IEEE Trans Electron Dev 55 2008 2512
-
(2008)
IEEE Trans Electron Dev
, vol.55
, pp. 2512
-
-
Tsormpatzoglou, A.1
Dimitriadis, C.A.2
Clerc, R.3
Pananakakis, G.4
Ghibaudo, G.5
-
9
-
-
33947700465
-
Analytical threshold voltage model with TCAD simulation verification for design and evaluation of tri-gate MOSFETs
-
Y. Jin, C. Zeng, L. Ma, and D. Barlage Analytical threshold voltage model with TCAD simulation verification for design and evaluation of tri-gate MOSFETs Solid-Sate Electron 51 2007 347
-
(2007)
Solid-Sate Electron
, vol.51
, pp. 347
-
-
Jin, Y.1
Zeng, C.2
Ma, L.3
Barlage, D.4
-
11
-
-
34547975753
-
2D modelling of nanoscale double gate silicon-on-insulator MOSFETs using conformal mapping
-
S. Kolberg, and T.A. Fjeldly 2D modelling of nanoscale double gate silicon-on-insulator MOSFETs using conformal mapping Physica Scripta T126 2006 57
-
(2006)
Physica Scripta
, vol.126 T
, pp. 57
-
-
Kolberg, S.1
Fjeldly, T.A.2
-
12
-
-
0031146748
-
Experimental determination of threshold voltage shifts due to quantum mechanical effects in MOS electron and hole inversion layers
-
G. Chindalore, S.A. Hareland, S. Jallepalli, A.F. Tasch, C.M. Maziar, and V.K.F. Chia Experimental determination of threshold voltage shifts due to quantum mechanical effects in MOS electron and hole inversion layers IEEE Electron Dev Lett 18 1997 206
-
(1997)
IEEE Electron Dev Lett
, vol.18
, pp. 206
-
-
Chindalore, G.1
Hareland, S.A.2
Jallepalli, S.3
Tasch, A.F.4
Maziar, C.M.5
Chia, V.K.F.6
-
14
-
-
33646519429
-
Lateral coupling and immunity to substrate effect in ΩfET devices
-
R. Ritzenhaler, S. Cristoloveanu, O. Faynot, C. Jahan, A. Kuriyama, and L. Brevard Lateral coupling and immunity to substrate effect in ΩFET devices Solid-State Electron 50 2006 558
-
(2006)
Solid-State Electron
, vol.50
, pp. 558
-
-
Ritzenhaler, R.1
Cristoloveanu, S.2
Faynot, O.3
Jahan, C.4
Kuriyama, A.5
Brevard, L.6
-
15
-
-
34547875434
-
Semi-analytical modeling of short-channel effects in Si and Ge symmetrical double-gate MOSFETs
-
A. Tsormpatzoglou, C.A. Dimitriadis, R. Clerc, Q. Rafhay, G. Pananakakis, and G. Ghibaudo Semi-analytical modeling of short-channel effects in Si and Ge symmetrical double-gate MOSFETs IEEE Trans Electron Dev 54 2007 1943
-
(2007)
IEEE Trans Electron Dev
, vol.54
, pp. 1943
-
-
Tsormpatzoglou, A.1
Dimitriadis, C.A.2
Clerc, R.3
Rafhay, Q.4
Pananakakis, G.5
Ghibaudo, G.6
-
16
-
-
79951680842
-
Analytical threshold voltage model for lightly doped short-channel tri-gate MOSFETs
-
A. Tsormpatzoglou, D.H. Tassis, C.A. Dimitriadis, G. Ghibaudo, N. Collaert, and G. Pananakakis Analytical threshold voltage model for lightly doped short-channel tri-gate MOSFETs Solid-State Electron 56 2011 31
-
(2011)
Solid-State Electron
, vol.56
, pp. 31
-
-
Tsormpatzoglou, A.1
Tassis, D.H.2
Dimitriadis, C.A.3
Ghibaudo, G.4
Collaert, N.5
Pananakakis, G.6
-
17
-
-
0032651359
-
Physically-based threshold voltage determination for MOSFET's of all gate lengths
-
M. Tsuno, M. Suga, M. Tanaka, K. Shibahara, M. Miura-Mattausch, and M. Hirose Physically-based threshold voltage determination for MOSFET's of all gate lengths IEEE Trans Electron Dev 46 1999 1429
-
(1999)
IEEE Trans Electron Dev
, vol.46
, pp. 1429
-
-
Tsuno, M.1
Suga, M.2
Tanaka, M.3
Shibahara, K.4
Miura-Mattausch, M.5
Hirose, M.6
-
18
-
-
0036540852
-
A review of recent MOSFET threshold voltage extraction methods
-
A. Ortiz-Conde, F.J. Garcia Sanchez, J.J. Liou, A. Cerdeira, M. Estrada, and Y. Yue A review of recent MOSFET threshold voltage extraction methods Microelectron Reliab 42 2002 583
-
(2002)
Microelectron Reliab
, vol.42
, pp. 583
-
-
Ortiz-Conde, A.1
Garcia Sanchez, F.J.2
Liou, J.J.3
Cerdeira, A.4
Estrada, M.5
Yue, Y.6
-
21
-
-
0036684706
-
FinFET design consideration based on 3-D simulation and analytical modeling
-
G. Pei, J. Kedzierski, P. Oldiges, M. Ieong, and E.C.C. Kan FinFET design consideration based on 3-D simulation and analytical modeling IEEE Trans Electron Dev 49 2002 1411
-
(2002)
IEEE Trans Electron Dev
, vol.49
, pp. 1411
-
-
Pei, G.1
Kedzierski, J.2
Oldiges, P.3
Ieong, M.4
Kan, E.C.C.5
-
22
-
-
53649100555
-
Semi-analytical modeling of short-channel effects in lightly doped silicon, tri-gate MOSFETs
-
A. Tsormpatzoglou, C.A. Dimitriadis, R. Clerc, G. Pananakakis, and G. Ghibaudo Semi-analytical modeling of short-channel effects in lightly doped silicon, tri-gate MOSFETs IEEE Trans Electron Dev 55 2008 2623
-
(2008)
IEEE Trans Electron Dev
, vol.55
, pp. 2623
-
-
Tsormpatzoglou, A.1
Dimitriadis, C.A.2
Clerc, R.3
Pananakakis, G.4
Ghibaudo, G.5
-
23
-
-
41749105329
-
A 3-D analytical physically based model for the subthreshold swing in undoped trigate FinFETs
-
H.A. El Hamid, J.R. Guitar, V. Kaltchytska, D. Flandre, and B. Iniquez A 3-D analytical physically based model for the subthreshold swing in undoped trigate FinFETs IEEE Trans Electron Dev 54 2007 2487
-
(2007)
IEEE Trans Electron Dev
, vol.54
, pp. 2487
-
-
El Hamid, H.A.1
Guitar, J.R.2
Kaltchytska, V.3
Flandre, D.4
Iniquez, B.5
-
25
-
-
61549092155
-
Experimental characterization of the subthreshold leakage current in triple-gate FinFETs
-
A. Tsormpatzoglou, C.A. Dimitriadis, M. Mouis, G. Ghibaudo, and N. Collaert Experimental characterization of the subthreshold leakage current in triple-gate FinFETs Solid-State Electron 53 2009 359
-
(2009)
Solid-State Electron
, vol.53
, pp. 359
-
-
Tsormpatzoglou, A.1
Dimitriadis, C.A.2
Mouis, M.3
Ghibaudo, G.4
Collaert, N.5
-
26
-
-
36849093891
-
Effect of Fin angle on electrical characteristics of nanoscale round-top-gate bulk FinFETs
-
Y. Li, and C.H. Hwang Effect of Fin angle on electrical characteristics of nanoscale round-top-gate bulk FinFETs IEEE Trans Electron Dev 54 2007 3426
-
(2007)
IEEE Trans Electron Dev
, vol.54
, pp. 3426
-
-
Li, Y.1
Hwang, C.H.2
|