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Volumn 21, Issue 15, 2011, Pages 2960-2967

A nanoimprint lithography hybrid photoresist based on the thiol-ene system

Author keywords

hybrid resists; silsesquioxanes; thiol enes; UV nanoimprint lithography

Indexed keywords

BARRIER MATERIAL; CROSSLINKER; DOUBLE LAYERS; DRY-ETCH; FEATURE SIZES; HIGH THERMAL STABILITY; HIGH-RESOLUTION PATTERNS; HYBRID RESISTS; LOW VISCOSITY; PATTERN TRANSFERS; POLYHEDRAL OLIGOMERIC SILSESQUIOXANES; SILICON SUBSTRATES; SILSESQUIOXANES; THIOL-ENE PHOTOPOLYMERIZATION; THIOL-ENE SYSTEMS; THIOL-ENES; TRANSFER PATTERNS; TRIMETHYLOLPROPANE TRIMETHACRYLATE; UV NANOIMPRINT LITHOGRAPHY; YOUNG'S MODULUS;

EID: 80051700468     PISSN: 1616301X     EISSN: 16163028     Source Type: Journal    
DOI: 10.1002/adfm.201100692     Document Type: Article
Times cited : (100)

References (58)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.