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Volumn , Issue , 2011, Pages 197-203

Circuit design challenges in embedded memory and resistive RAM (RRAM) for mobile SoC and 3D-IC

Author keywords

[No Author keywords available]

Indexed keywords

BATTERY LIFE TIME; CIRCUIT DESIGNS; COMPLEX OPERATIONS; DYNAMIC POWER CONSUMPTION; EMBEDDED MEMORIES; FUNCTIONAL FAILURE; IC CHIPS; LOW POWER; LOW SUPPLY VOLTAGES; LOW VOLTAGE CIRCUITS; LOW-YIELD; MEMORY INTERFACE; MOBILE SYSTEMS; VOLTAGE STRESS;

EID: 79952915828     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2011.5722184     Document Type: Conference Paper
Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.