A 15ns 4Mb NVSRAM in 0.13u SONOS technology

2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design, Proceedings, NVSMW/ICMTD

Volumn , Issue , 2008, Pages 83-86

  Fliesler, Michael ^a   Still, David ^b   Hwang, Jeong Mo ^b  

^a CYPRESS SEMICONDUCTOR   (United States)

^b Simtek Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DURABILITY; ELECTRIC CONDUCTIVITY; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR STORAGE;

FOWLER-NORDHEIM; INTEGRATED ARCHITECTURES; INTERNATIONAL CONFERENCES; MEMORY TECHNOLOGY; NON-VOLATILE; NON-VOLATILE MEMORIES; SEMICONDUCTOR MEMORIES;

TECHNOLOGY;

EID: 50249187802     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NVSMW.2008.30     Document Type: Conference Paper

References (7)

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4. M.H. White, et al., IEEE Circuits and Devices, vol. 16, pp. 22-31, May 2000
5. Y. Wang, and M.H. White, Solid State Electronics, vol.49, pp.97-107, 2005
6. S. Kumar, and E. Russel, 2001 IEEE IRW (International Reliability Workshop) Final Report, pp.34-40
7. J. Hwang, and T. Wallinger, 2007 IEEE IRW Final Report, pp.147-149