Analysis and reduction of supply noise fluctuations induced by embedded via-programming ROM

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 17, Issue 6, 2009, Pages 758-769

  Chang, Meng Fan ^a   Yang, Shu Meng ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Code patterns; Peak current; Read only memory (ROM); Supply noise

Indexed keywords

CODE-PATTERNS; CURRENT PROFILE; DATA PATTERNS; DE-COUPLING CAPACITANCE; PEAK CURRENT; PEAK CURRENTS; PERIPHERAL CIRCUITS; QFN PACKAGE; READ ONLY MEMORY (ROM); READ-ONLY MEMORIES; ROW DECODER; SUPPLY NOISE;

ROM;

EID: 67349087909     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2008.2006794     Document Type: Article

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