Models of atomic scale contrast in dissipation images of binary ionic surfaces in non-contact atomic force microscopy

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Trevethan, T ^a   Kantorovich, L ^a  

^a KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISSIPATION; IONS; MATHEMATICAL MODELS; NANOTECHNOLOGY; THERMAL EFFECTS;

DISSIPATION IMAGES; IONIC SURFACES; MICROSCOPIC TIP SURFACE SYSTEM; NON CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM); SINGLE ATOM MANIPULATION;

ATOMIC FORCE MICROSCOPY;

EID: 33644967858     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S18     Document Type: Article

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