Molecular-scale noncontact atomic force microscopy contrasts in topography and energy dissipation on c(4×2) superlattice structures of alkanethiol self-assembled monolayers

Journal of Applied Physics

Volumn 95, Issue 3, 2004, Pages 1222-1226

  Fukuma, Takeshi ^a   Ichii, Takashi ^a   Kobayashi, Kei ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ELECTRONIC STRUCTURE; ENERGY DISSIPATION; MOLECULAR STRUCTURE; MONOLAYERS; NUMERICAL METHODS; PHASE COMPOSITION; SCANNING TUNNELING MICROSCOPY;

ALKANETHIOL; DODECANETHIOL; FREQUENCY MODULATION DETECTION METHOD; MOLECULAR SCALE TOPOGRAPHIC CONTRASTS; SELF ASSEMBLED MONOLAYERS;

SUPERLATTICES;

EID: 1142304496     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1636831     Document Type: Article

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