Chemical identification of ions in doped NaCl by scanning force microscopy

Physical Review Letters

Volumn 102, Issue 25, 2009, Pages

  Foster, Adam S ^a,b   Barth, Clemens ^c   Henry, Claude R ^c  

^a AALTO UNIVERSITY   (Finland)

^b TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^c AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL IDENTIFICATION; IMPURITY CHEMISTRY; NACL CRYSTAL; NANO-OBJECTS; QUANTITATIVE COMPARISON; SCANNING FORCE MICROSCOPY; SURFACE TERMINATION;

CRYSTAL IMPURITIES; CRYSTAL STRUCTURE; SCANNING TUNNELING MICROSCOPY;

SODIUM CHLORIDE;

EID: 67649482428     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.102.256103     Document Type: Article

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