Atomic resolution imaging on CeO2(111) with hydroxylated probes

Journal of Physical Chemistry C

Volumn 112, Issue 6, 2008, Pages 2045-2049

  Gritschneder, Sebastian ^a,b   Reichling, Michael ^a  

^a UNIVERSITY OF OSNABRÜCK   (Germany)

^b UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HYDROXYLATION; OXYGEN; SILICON COMPOUNDS; STOICHIOMETRY;

ATOMIC RESOLUTION IMAGING; HYDROXYLATED PROBES;

CERIUM COMPOUNDS;

EID: 40049091922     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp076994y     Document Type: Article

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