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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 44, Issue 7 B, 2005, Pages 5325-5327

Dissipation imaging with low amplitude off-resonance atomic force microscopy

(5) Özer, H Özgür a O'Brien, Simon J a Norris, Andrew a Sader, John E b Pethica, John B a

a TRINITY COLLEGE DUBLIN (Ireland)

b UNIVERSITY OF MELBOURNE (Australia)

Author keywords

Atomic force microscopy; Dissipation; Force gradient; Harmonic coupling; Low amplitude; Phase; Scanning tunneling microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; COUPLED CIRCUITS; NATURAL FREQUENCIES; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY; SILICON;

DISSIPATION IMAGING; PHASE CONTRAST;

OPTICAL RESOLVING POWER;

EID: 31844447372 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.44.5325 Document Type: Article

Times cited : (8)

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