Experimental study on energy dissipation induced by displacement current in non-contact aomic force microscopy imaging of molecular thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 7 B, 2002, Pages 4903-4907

  Fukuma, Takeshi ^a   Umeda, Keiichi ^a   Kobayashi, Kei ^a   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Electrostatic interaction; Energy dissipation; Kelvin force microscopy; Non contact AFM; Thiophene

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ENERGY DISSIPATION; MONOLAYERS; SUBSTRATES;

KELVIN FORCE MICROSCOPY;

THIN FILMS;

EID: 0036657184     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4903     Document Type: Conference Paper

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