Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)

Applied Surface Science

Volumn 144-145, Issue , 1999, Pages 608-612

  Sushko, Peter V ^a   Foster, Adam S ^a   Kantorovich, Lev N ^a   Shluger, Alexander L ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

NaCl surface; Noncontact SFM; Silicon tip contamination

Indexed keywords

ADSORPTION; QUANTUM THEORY; SILICON; SODIUM CHLORIDE; SURFACES;

SCANNING FORCE MICROSCOPY; SILICON TIP CONTAMINATION;

ATOMIC FORCE MICROSCOPY;

EID: 0032630883     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00875-7     Document Type: Article

References (28)

1. F.J. Giessibl, Science 267 (1995) 68.
2. M. Bammerlin et al., Probe Microsc. 1 (1997) 3.
3. M. Bammerlin et al., Appl. Phys. A 66 (1998) S293.
4. F.J. Giessibl, Phys. Rev. B 56 (1997) 16010.
5. D. Kruger, B. Anczykowski, H. Fuchs, Ann. Phys. 6 (1997) 341.
6. R. Erlandsson, L. Olsson, P. Mártensson, Phys. Rev. B 54 (1996) R8309.
7. J.B. Pethica, A.P. Sutton, J. Vac. Sci. Technol. A 6 (1988) 2490.
8. J.R. Smith, G. Bozzolo, A. Banerjea, J. Ferrante, Phys. Rev. Lett. 63 (1989) 1269.
9. U. Landman, W.D. Luedtke, N.A. Burnham, R.J. Colton, Science 248 (1990) 454.
10. A.L. Shluger, A.L. Rohl, D.H. Gay, R.T. Williams, J. Phys.: Condens. Matter 6 (1994) 1825.
11. A.L. Shluger, L.N. Kantorovich, A.I. Livshits, M.J. Gillan, Phys. Rev. B 56 (1997) 15332.
12. M.J. Frisch, G.W. Trucks, H.B. Schlegel, P.M. W. Gill, B.G. Johnson et al., Gaussian94, E.1 edn., Gaussian, Pittsburgh, PA, 1995.
13. B.G. Dick, A.W. Overhauser, Phys. Rev. 112 (1958) 90.
14. R. Car, M. Parrinello, Phys. Rev. Lett. 55 (1985) 2471.
15. G. Kresse, J. Furthmuller, Phys. Rev. B 54 (1996) 11169.
16. G. Kresse, J. Furthmuller, Comp. Mater. Sci. 6 (1996) 15.
17. D. Vanderbilt, Phys. Rev. B 41 (1990) 7892.
18. K. Laasonen, A. Pasquarello, R. Car, C. Lee, D. Vanderbilt, Phys. Rev. B 47 (1993) 10142.
19. J.P. Perdew, in: P. Ziesche, H. Eschrig (Eds.), Electronic Structure in Solids' 91, Academie Verlag, Berlin, 1991.
20. J.P. Perdew, J.A. Chevary, S.H. Vosko, K.A. Jackson, M.R. Pederson, D.J. Singh, C. Fiolhais, Phys. Rev. B 46 (1992) 6671.
21. E. Kaxiras, Phys. Rev. Lett. 64 (1990) 551.
22. K. Takayanagi, Y. Tanishiro, M. Takahashi, S. Takahashi, J. Vac. Sci. Technol. A 3 (1981) 1502.
23. R. Pérez, M.C. Payne, I. Stich, K. Terakura, Phys. Rev. Lett. 78 (1997) 678.
24. C. Pancey et al., Surf. Sci. 338 (1995) 143.
25. M. Krack, K. Jug, Chem. Phys. 192 (1995) 127.
26. A.I. Livshits, A.L. Shluger, A.L. Rohl, A. Foster, Phys. Rev. B (1998) submitted.
27. M.A. Zaibi, J.P. Lacharme, C.A. Sebenne, Surf. Sci. 377 (1997) 639.
28. Y. Fukano et al., Jpn. J. Appl. Phys. 35 (1996) 2394.