Polarized tips or surfaces: Consequences in Kelvin probe force microscopy

e-Journal of Surface Science and Nanotechnology

Volumn 9, Issue , 2011, Pages 6-14

  Hynninen, T ^a,b   Foster, A S ^a,b   Barth, C ^c  

^a TAMPERE UNIVERSITY OF TECHNOLOGY   (Finland)

^b AALTO UNIVERSITY   (Finland)

^c CNRS   (France)

Author keywords

Atomic force microscopy; Charge detection; Density functional calculations; Kelvin probe force microscopy; Magnesium oxides; Thin insulating films

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY FUNCTIONAL THEORY; MAGNESIA; SILVER;

ATOMIC RESOLUTION; CHARGE DETECTION; FORCE SPECTROSCOPY; KELVIN PROBE FORCE MICROSCOPY; LATERAL RESOLUTION; NONCONTACT ATOMIC FORCE MICROSCOPY; THIN INSULATING FILM; WORKING DISTANCES;

PROBES;

EID: 78751502843     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2011.6     Document Type: Conference Paper

References (48)

1. M. Nonnenmacher, M. P. O Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
2. J. M. R. Weaver and D. W. Abraham, J. Vac. Sci. Technol. B 9, 1559 (1991).
3. P. Girard, Nanotechnology 12, 485 (2001).
4. V. Palermo, M. Palma, and P. Samori, Adv. Mater. 18, 145 (2006).
5. R. Berger, H. J. Butt, M. B. Retschke, and S. A. L. Weber, Macromol. Rapid Commun. 30, 145 (2009).
6. Noncontact Atomic Force Microscopy, Eds. S. Morita, R. Wiesendanger, and E. Meyer (Springer-Verlag, Berlin, 2002).
7. A. Kikukawa, S. Hosaka, and R. Imura, Rev. Sci. Instrum. 67, 1463 (1996).
8. S. Kitamura and M. Iwatsuki, Appl. Phys. Lett. 72, 3154 (1998).
9. C. Sommerhalter, T. W. Matthes, T. Glatzel, A. Jäger-Waldau, and M. C. Lux-Steiner, Appl. Phys. Lett. 75, 286 (1999).
10. F. Krok, J. J. Kolodziej, B. Such, P. Czuba, P. Struski, P. Piatkowski, and M. Szymonski, Surf. Sci. 566, 63 (2004).
11. C. Loppacher, U. Zerweck, and L. M. Eng, Nanotechnology 15, 9 (2004).
12. M. Bieletzki, T. Hynninen, T. M. Soini, M. Pivetta, A. S. Foster, F. Esch, C. Barth, and U. Heiz, Phys. Chem. Chem. Phys. 12, 3203 (2010).
13. M. Goryl, F. Krok, J. J. Kolodziej, P. Piatkowski, B. Such, and M. Szymonski, Vacuum 74, 223 (2004).
14. U. Zerweck, C. Loppacher, T. Otto, S. Grafström, and L. M. Eng, Nanotechnology 18, 84006 (2007).
15. H. O. Jacobs, P. Leuchtmann, O. J. Homan, and A. Stemmerb, J. Appl. Phys. 84, 1168 (1998).
16. T. Glatzel, L. Zimmerli, S. Koch, B. Such, S. Kawai, and E. Meyer, Nanotechnology 20, 264016 (2009).
17. G. H. Enevoldsen, T. Glatzel, M. C. Christensen, J. V. Lauritsen, and F. Besenbacher, Phys. Rev. Lett. 100, 236104 (2008).
18. C. Barth and C. R. Henry, Nanotechnology 17, S155 (2006).
19. C. Barth and C. R. Henry, Phys. Rev. Lett. 98, 136804 (2007).
20. C. Barth and C. R. Henry, Appl. Phys. Lett. 89, 252119 (2006).
21. C. Barth and C. R. Henry, J. Phys. Chem. C 113, 247 (2009).
22. B. D. Terris, J. E. Stern, D. Rugar and H. J. Mamin, Phys. Rev. Lett. 63, 2669 (1989).
23. E. B. Bussmann, N. Zheng and C. C. Williams, Nano Lett. 6, 2577 (2006).
24. S. S. P. Parkin, C. Kaiser, A. Panchula, P. M. Rice, B. Hughes, M. Samant, and S.-H. Yang, Nature Mater. 3, 862 (2004).
25. S. Yuasa, T. Nagahama, A. Fukushima, Y. Suzuki, and K. Ando, Nature Mater. 3, 868 (2004).
26. Nanocatalysis, Eds. U. Heiz and U. Landman (Springer-Verlag, Berlin, 2006).
27. H. J. Freund and G. Pacchioni, Chem. Soc. Rev. 37, 2224 (2008).
28. C. Harding, V. Habibpour, S. Kunz, A. N. S. Farnbacher, U. Heiz, B. Yoon, and U. Landman, J. Am. Chem. Soc. 131, 538 (2009).
29. M. E. Vaida, T. M. Bernhardt, C. Barth, F. Esch, U. Heiz, and U. Landman, Phys. Status Solidi B 247, 1001 (2010).
30. C. Barth, T. Hynninen, M. Bieletzki, C. R. Henry, A. S. Foster, F. Esch, and U. Heiz, New J. Phys. 12, 093024 (2010).
31. L. Giordano, U. Martinez, G. Pacchioni, M. Watkins, and A. L. Shluger, J. Phys. Chem. C 112, 3857 (2008).
32. F. Bocquet, L. Nony, and C. Loppacher, preprint (submitted to Phys. Rev. B).
33. G. Kresse and J. Furthmuller, Phys. Rev. B 54, 11169 (1996).
34. H. J. Monkhorst and J. Pack, Phys. Rev. B 54, 11169 (1976).
35. L. N. Kantorovich, A. I. Livshits, and M. Stoneham, J. Phys. Condens. Matter 12, 795 (2000).
36. L. N. Kantorovich, A. S. Foster, A. L. Shluger, and A. M. Stoneham, Surf. Sci. 445, 283 (2000).
37. Th. Glazel, S. Sadewasser, and M. C. Lux-Steiner, Appl. Surf. Sci. 210, 84 (2003).
38. U. Zerweck, C. Loppacher, T. Otto, S. Grafstrom, and L. M. Eng, Phys. Rev. B 71, 125424 (2005).
39. T. Takahashi and S. Ono, Ultramicroscopy 100, 287 (2004).
40. S. Hudlet, M. Saint Jean, C. Guthmann, and J. Berger, Eur. Phys. J. B 2, 5 (1998).
41. L. Nony, A. S. Foster, F. Bocquet, and Ch. Loppacher, Phys. Rev. Lett. 103, 036802 (2009).
42. S. Sadewasser, P. Jelinek, Ch. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita, Phys. Rev. Lett. 103, 266103 (2009).
43. S. Sadewasser, C. Leendertz, F. Streicher, and M. Ch. Lux-Steiner, Nanotechnology 20, 505503 (2009).
44. L. Giordano, F. Cinquini and G. Pacchioni, Phys. Rev. B 73, 045414 (2006).
45. T. König, G. H. Simon, H.-P. Rust, and M. Heyde, J. Phys. Chem. C 113, 11301 (2009).
46. S. Ono and T. Takahashi, Jpn. J. Appl. Phys. 43, 4639 (2004).
47. S. Belaidi, P. Girard, and G. Leveque, J. Appl. Phys. 81, 1023 (1997).
48. L. Gross, F. Mohn, P. Liljeroth, J. Repp, F. J. Giessibl, and G. Meyer, Science 324, 1428 (2009).