Surface structure of Au/InSb(0 0 1) system investigated with scanning force microscopy

Vacuum

Volumn 74, Issue 2, 2004, Pages 223-227

  Goryl, M ^a   Krok, F ^a   Kolodziej, J J ^a   Piatkowski, P ^a   Such, B ^a   Szymonski, M ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

Au; Contact potential difference (CPD); DFM; Growth; InSb; KPFM

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALS; ELECTROSTATICS; GOLD; LOW ENERGY ELECTRON DIFFRACTION; SUBSTRATES; SURFACE STRUCTURE;

COMPLEX REACTIVE SYSTEMS; DYNAMIC FORCE MICROSCOPY; KELVIN PROBE FORCE MICROSCOPY (KPFM); SCANNING PROBE MICROSCOPY (SPM); WORK FUNCTIONS;

THIN FILMS;

EID: 2342584193     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2003.12.128     Document Type: Conference Paper

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