Sixty thousand hour light output reliability of AlGaInP light emitting diodes

IEEE Transactions on Device and Materials Reliability

Volumn 6, Issue 4, 2006, Pages 564-574

  Grillot, Patrick N ^b   Krames, Michael R ^a,b   Zhao, Hanmin ^b   Teoh, Seng Hup ^b  

^a IEEE

^b Philips Lumileds Lighting Company   (United States)

Author keywords

Current dependent reliability; Degradation mechanisms; Radiative recombination; Reliability testing; Semiconductor defects; Semiconductor device reliability; Shockley Read Hall recombination

Indexed keywords

CRYSTAL DEFECTS; FUNCTION EVALUATION; LIGHT EMITTING DIODES; RELIABILITY; SILICON WAFERS; STRESS ANALYSIS;

CURRENT-DEPENDENT RELIABILITY; DEGRADATION MECHANISMS; RADIATIVE RECOMBINATION; RELIABILITY TESTING; SEMICONDUCTOR DEVICE RELIABILITY; SHOCKLEY-READ-HALL RECOMBINATION;

ALUMINUM COMPOUNDS;

EID: 33845534547     PISSN: 15304388     EISSN: 15304388     Source Type: Journal    
DOI: 10.1109/TDMR.2006.887416     Document Type: Article

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