Thermally activated degradation and package instabilities of low flux leds

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2009, Pages 98-103

  Trevisanello, L ^a   De Zuani, F ^a   Meneghini, M ^a   Trivellin, N ^a   Zanoni, E ^a   Meneghesso, G ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFE; ACCELERATED STRESS; AGING CONDITIONS; CHROMATIC SHIFTS; COMPARATIVE ANALYSIS; CONSTANT TEMPERATURE; DEGRADATION MECHANISM; LOW FLUX; LOW IMPEDANCE PATHS; LUMINOUS FLUX; STRESS-INDUCED; THERMALLY ACTIVATED; THERMALLY ACTIVATED DEGRADATION;

DEGRADATION; FAILURE MODES; LIGHT EMISSION; LIGHT EMITTING DIODES; SAFETY FACTOR;

RELIABILITY;

EID: 70449093806     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2009.5173231     Document Type: Conference Paper

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