Quantitative phase imaging of nanoscale electrostatic and magnetic fields using off-axis electron holography

Ultramicroscopy

Volumn 110, Issue 5, 2010, Pages 375-382

  McCartney, Martha R ^a   Agarwal, Nipun ^a,b   Chung, Suk ^a,c   Cullen, David A ^a   Han, Myung Geun ^a,d   He, Kai ^a   Li, Luying ^a   Wang, Hua ^a,e   Zhou, Lin ^a   Smith, David J ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Headway Technologies Inc   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

^e Arizona State University   (United States)

Author keywords

Magnetization reversal; Off axis electron holography; Polarization fields; Semiconductor devices

Indexed keywords

ELECTROSTATIC POTENTIALS; GAAS; GE QUANTUM DOT; HETEROSTRUCTURES; HOLE ACCUMULATION; III-NITRIDE; INTERFEROMETRIC TECHNIQUES; NANO SCALE; NANO-METER SCALE; OFF-AXIS ELECTRON HOLOGRAPHY; PHASE IMAGING; PHASE QUANTIFICATION; POLARIZATION FIELD; POLARIZATION FIELDS; REMANENT STATE; REVERSAL MECHANISM; SAMPLE PREPARATION; SEMICONDUCTOR HETEROSTRUCTURES; SPATIAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPE;

CRYSTALS; ELECTRON HOLOGRAPHY; ELECTRONS; ELECTROSTATIC DEVICES; ELECTROSTATICS; GERMANIUM; HETEROJUNCTIONS; MAGNETIC DEVICES; MAGNETIC FIELDS; NANOMAGNETICS; NANOSTRUCTURED MATERIALS; NITRIDES; POLARIZATION; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR SWITCHES; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETIZATION REVERSAL;

GALLIUM ARSENIDE; GERMANIUM; QUANTUM DOT; SILICON;

ARTICLE; CONTROLLED STUDY; ELECTRIC FIELD; ELECTRIC POTENTIAL; HOLOGRAPHY; IMAGING; MAGNETIC FIELD; NANOTECHNOLOGY; OFF AXIS ELECTRON HOLOGRAPHY; POLARIZATION; SEMICONDUCTOR; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77952320927     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.01.001     Document Type: Article

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