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Applied Physics Letters

Volumn 92, Issue 14, 2008, Pages

In situ electron holographic analysis of biased Si n+ -p junctions

(3) Han, Myung Geun a Smith, David J a McCartney, Martha R a

a ARIZONA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTROCHEMICAL ELECTRODES; ELECTRON HOLOGRAPHY; ELECTROSTATICS; FOCUSED ION BEAMS;

BIASING CONDITIONS; ELECTROSTATIC POTENTIAL; REVERSE BIASING; SAMPLE HOLDERS;

SEMICONDUCTOR JUNCTIONS;

EID: 42149171824 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2908045 Document Type: Article

Times cited : (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.